| RELIABILITY |
| Reliability Program of Diode |
 |
January 2007 |
| Reliability test program of resistor |
|
July 2007 |
| Reliability Experiment Summary - MBR10100CT |
|
January 2007 |
| Reliability Experiment Summary - MBR20100CT |
|
January 2007 |
| Avalanche Level Test of 150V Schottky |
|
January 2007 |
| QA & Riliability equipment list |
|
November 2007 |
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| QA/QC |
| Assembly process flowchart |
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November 2007 |
| Wafer process flowchart |
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November 2007 |
| QA Monitor Activities |
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January 2007 |
| Incoming Inspection Flowchart |
|
January 2007 |
| Failure Analysis Capability |
|
January 2007 |
| QA Gate Acceptance |
|
January 2007 |
| IN Process Monitor |
|
January 2007 |
| General DCC Procedure |
|
January 2007 |
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| TESTING DATA REPORT |
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| SBD, Cr Barrier 15V- |
SBL40L15CT |
|
|
| SBD, Alloy Barrier 30V- |
SBL3030CT
|
SBL3030PT |
|
| SBD, Mo Barrier 40V/45V- |
SB540
|
SBL20L45CT |
SBL30L45CT |
| SBD, Mo Barrier 55V- |
SBL2055C
|
SBL4045PT |
|
| SBD, Mo Barrier 60V- |
SB560FC
|
SBL30LL60CT |
SBL40L60CT |
| SBD, Pt Barrier 60V- |
MBR20L60CT
|
MBRH300SPT |
MBRH300EPT |
| SBD, Pt Barrier 100V- |
SB3100 |
SB5100
|
SB5100FC |
| |
MBR10100C
|
MBR10100CT |
MBR10100FCT |
| |
MBR10L100FCT
|
MBR20100CT |
MBR30100PT |
| |
MBR40100PT
|
MBR60100PT |
|
| SBD, Pt Barrier 150V- |
MBR10150CT
|
MBR10150FCT |
MBR20150CT
|
| |
MBR20150FCT
|
MBR20L150CT
|
MBR40150PT |
| SBD, Pt Barrier 200V- |
MBR10200CT
|
MBR10200FCT
|
MBR20200CT |
|
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| TEMPERATURE CYCLE |
BURN-IN OVEN |
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